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ADE7768
TYPICAL PERFORMANCE CHARACTERISTICS
V DD
1
100nF
+
10 μ F
602k Ω
2
V2P
V DD
F1 16
1
U3
4
K7
220V
200 Ω
150nF
U1
F2 15
40A TO
40mA
200 Ω
150nF
3
ADE7768 CF 14
V2N
REVP 12
820 Ω
2
3
PS2501-1
K8
350 μΩ
+
200 Ω
150nF
200 Ω
5
V1P
RCLKIN 11
6.2k Ω
V DD
150nF
4
V1N
S0 10
10k Ω
1 μ F
+
100nF
7
REF IN/OUT
AGND DGND
S1 9
SCF 8
10nF
10nF
10nF
6
13
Figure 4. Test Circuit for Performance Curves
1.0
1.0
0.8
0.6
0.4
0.2
0
PF = 1
ON-CHIP REFERENCE
–40 ° C
0.8
0.6
0.4
0.2
0
PF = 1
EXTERNAL REFERENCE
+85 ° C
–0.2
–0.4
+85 ° C
+25 ° C
–0.2
–0.4
–40 ° C
+25 ° C
–0.6
–0.8
–1.0
–0.6
–0.8
–1.0
0.1
1
10
100
0.1
1
10
100
1.0
CURRENT CHANNEL (% of Full Scale)
Figure 5. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 1)
1.0
CURRENT CHANNEL (% of Full Scale)
Figure 7. Error as a % of Reading over Temperature
with External Reference (PF = 1)
0.8
0.6
0.4
PF = 0.5 IND
ON-CHIP REFERENCE
–40 ° C, PF = 0.5 IND
0.8
0.6
0.4
PF = 0.5 IND
EXTERNAL REFERENCE
0.2
+25 ° C, PF = 1
0.2
+85 ° C, PF = 0.5 IND
+25 ° C, PF = 1
0
–0.2
0
–0.2
–0.4
+85 ° C, PF = 0.5 IND
+25 ° C, PF = 0.5 IND
–0.4
+25 ° C, PF = 0.5 IND
–0.6
–0.8
–1.0
–0.6
–0.8
–1.0
–40 ° C, PF = 0.5 IND
0.1
1
10
100
0.1
1
10
100
CURRENT CHANNEL (% of Full Scale)
Figure 6. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 0.5 IND)
Rev. A | Page 8 of 20
CURRENT CHANNEL (% of Full Scale)
Figure 8. Error as a % of Reading over Temperature
with External Reference (PF = 0.5 IND)
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